Re: Arrhenius activation energy for Copper and tin migration (in fluids) susceptibility

From: Robert Baer (bobbaer_at_earthlink.net)
Date: 02/17/05 

Date: Thu, 17 Feb 2005 21:53:57 GMT

WayneL wrote:
>
> Hi
>
> In the electronics industry they use the Arrhenius model for reliability
> engineering, esp in migration susceptibility.
> One of the figure used in the Arrhenius equation is the activation energy.
> They tend to use a figure between 0.5eV and 0.9eV, and seems to be based on
> empirical data.
> Can anyone help me understand where they may have got these figures e.g. is
> it the migration susceptibility of say copper or tin ?
> Also, where could I ref. the activation energies for different metal?
>
> Regards
>
> Wayne

  Perhaps the Chem Rubber handbook might have a table or data on that or
related values.

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