TEM specimen preparation

From: CrystalLee (crystal_at_kicet.re.kr)
Date: 09/23/04

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    Date: 22 Sep 2004 18:51:49 -0700

    Hello there !

    I'got a question. I want to observe the cross sectional specimen by
    TEM.
    The specimen is amorphous mesoporous silica thin film on Si substrate.
    We've gave a lot of effort to succeed, with little success. Ion
    milling and
    Ultramicroscopy. What we want is to confirmed the periodicity of the
    pores.
    Anybody has experience with this kind of specimen? We don't have FIB.
     Look forward to your comments.

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