Re: Schlieren Microscopes
- From: hbarwood@xxxxxxxx
- Date: 21 Nov 2005 16:27:24 -0800
Hi Rene,
I am intrigued by the potential of the method to detect subtle
variations in refractive index/dispersion. I work with petrographic
thin sections and would like to look for compositional gradients in
minerals. There are lots of techniques to do this, but I am always on
the lookout for something new.
Henry
.
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