Re: drift correction

On Feb 14, 11:13 pm, "Rostislav Lapshin" <rlaps...@xxxxxxxxx> wrote:
Dear Microscopists,

When measuring topography and surface properties with probe
instruments in nanometer scale at room temperature, drift of the probe
relative to the sample surface is an important issue of the
measurements precision. I would like those interested in the problem
to pay attention to a simple but effective method based on counter-
scanning. Being used together with topography feature recognition, the
method is fully automatic. If no suitable recognition software is
available, the method may be used as semiautomatic. Also, the method
suggested is easy to embed in feature-oriented scanning (an active
scanning approach which uses surface features as reference points).
The method may be applied to any device that has a probe (mechanical
tip, focused light beam, focused electron beam, focused ion beam,
etc.), a scanning system (scanner) and a unit that registers results
of probe interaction with the measured surface.

Detailed description of the method is to be found in my paper
"Automatic drift elimination in probe microscope images based on
techniques of counter-scanning and topography feature recognition"
recently published in Measurement Science and Technology (vol. 18,
iss. 3, pp. 907-927, 2007). So far the paper is freely available athttp://stacks.iop.org/MST/18/907.

Thank you for your attention.

Best regards,

Rostislav V. Lapshin

Rostislav V. Lapshin, Ph. D.
Staff Scientist
Solid Nanotechnology Laboratory
Institute of Physical Problems
Zelenograd, Moscow, 124460
Russian Federation

tel: +7 (495) 536-9379
fax: +7 (495) 531-5592

pri email: rlaps...@xxxxxxxxx
sec email: rlaps...@xxxxxxxxx

web:http://www.nanoworld.org/homepages/lapshin/

Interesting work.

Thanks,

Gregor

.

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